Login / Signup
Franco Zanon
Publication Activity (10 Years)
Years Active: 2006-2017
Publications (10 Years): 2
Top Topics
Infrared
Physical Sciences
Trading Systems
Website
Top Venues
Microelectron. Reliab.
</>
Publications
</>
Abdellatif Bey-Temsamani
,
S. Kauffmann
,
Y. Descas
,
Bart Vandevelde
,
Franco Zanon
,
Geert Willems
Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems.
Microelectron. Reliab.
(2017)
Bart Vandevelde
,
Filip Vanhee
,
Davy Pissoort
,
Lieven Degrendele
,
Johan de Baets
,
Bart Allaert
,
Ralph Lauwaert
,
Franco Zanon
,
Riet Labie
,
Geert Willems
Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components.
Microelectron. Reliab.
74 (2017)
Nicolo Ronchi
,
Franco Zanon
,
Antonio Stocco
,
Augusto Tazzoli
,
Enrico Zanoni
,
Gaudenzio Meneghesso
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test.
Microelectron. Reliab.
49 (9-11) (2009)
Augusto Tazzoli
,
Gaudenzio Meneghesso
,
Franco Zanon
,
Francesca Danesin
,
Enrico Zanoni
,
Philippe Bove
,
R. Langer
,
J. Thorpe
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields.
Microelectron. Reliab.
48 (8-9) (2008)
Francesca Danesin
,
Augusto Tazzoli
,
Franco Zanon
,
Gaudenzio Meneghesso
,
Enrico Zanoni
,
Antonio Cetronio
,
Claudio Lanzieri
,
Simone Lavanga
,
Marco Peroni
,
Paolo Romanini
Thermal storage effects on AlGaN/GaN HEMT.
Microelectron. Reliab.
48 (8-9) (2008)
Francesca Danesin
,
Franco Zanon
,
Simone Gerardin
,
Fabiana Rampazzo
,
Gaudenzio Meneghesso
,
Enrico Zanoni
,
Alessandro Paccagnella
Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
46 (9-11) (2006)