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Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test.

Nicolo RonchiFranco ZanonAntonio StoccoAugusto TazzoliEnrico ZanoniGaudenzio Meneghesso
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • reliability analysis
  • long term
  • short term
  • databases
  • neural network
  • survival analysis
  • fault tree