Augusto Tazzoli

Publication Activity (10 Years)

Years Active: 2005-2013
Publications (10 Years): 0

Top Topics

Contour Matching

Top Venues

Microelectron. Reliab.

Publications

Jabeom Koo, Augusto Tazzoli, Jeronimo Segovai-Fernandez, Gianluca Piazza, Brian P. Otis
A -173 dBc/Hz @ 1 MHz offset Colpitts oscillator using AlN contour-mode MEMS resonator. CICC (2013)
Vehbi Calayir, Tom Jackson, Augusto Tazzoli, Gianluca Piazza, Larry T. Pileggi
Neurocomputing and associative memories based on ovenized aluminum nitride resonators. IJCNN (2013)
Anna Persano, Augusto Tazzoli, Paola Farinelli, Gaudenzio Meneghesso, Pietro Siciliano, Fabio Quaranta
K-band capacitive MEMS switches on GaAs substrate: Design, fabrication, and reliability. Microelectron. Reliab. 52 (9-10) (2012)
Augusto Tazzoli, Isabella Rossetto, Enrico Zanoni, Dai Yufeng, Tiziana Tomasi, Gaudenzio Meneghesso
ESD sensitivity of a GaAs MMIC microwave power amplifier. Microelectron. Reliab. 51 (9-11) (2011)
Jacopo Iannacci, Alessandro Faes, A. Repchankova, Augusto Tazzoli, Gaudenzio Meneghesso
An active heat-based restoring mechanism for improving the reliability of RF-MEMS switches. Microelectron. Reliab. 51 (9-11) (2011)
Augusto Tazzoli, Matteo Rinaldi, Chengjie Zuo, Nipun Sinha, Jan Van der Spiegel, Gianluca Piazza
Aluminum Nitride reconfigurable RF-MEMS front-ends. ASICON (2011)
Augusto Tazzoli, Marco Barbato, F. Mattiuzzo, V. Ritrovato, Gaudenzio Meneghesso
Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches. Microelectron. Reliab. 50 (9-11) (2010)
Augusto Tazzoli, Martina Cordoni, Paolo Colombo, C. Bergonzoni, Gaudenzio Meneghesso
Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform. Microelectron. Reliab. 50 (9-11) (2010)
Jacopo Iannacci, A. Repchankova, Alessandro Faes, Augusto Tazzoli, Gaudenzio Meneghesso, Gian-Franco Dalla Betta
Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism. Microelectron. Reliab. 50 (9-11) (2010)
Augusto Tazzoli, Lorenzo Cerati, A. Andreini, Gaudenzio Meneghesso
Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology. Microelectron. Reliab. 49 (9-11) (2009)
Nicolo Ronchi, Franco Zanon, Antonio Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso
Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test. Microelectron. Reliab. 49 (9-11) (2009)
Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, Philippe Bove, R. Langer, J. Thorpe
Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields. Microelectron. Reliab. 48 (8-9) (2008)
Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini
Thermal storage effects on AlGaN/GaN HEMT. Microelectron. Reliab. 48 (8-9) (2008)
Augusto Tazzoli, Fabio Alessio Marino, Martina Cordoni, A. Benvenuti, Paolo Colombo, Enrico Zanoni, Gaudenzio Meneghesso
Holding voltage investigation of advanced SCR-based protection structures for CMOS technology. Microelectron. Reliab. 47 (9-11) (2007)
Augusto Tazzoli, Gaudenzio Meneghesso, Enrico Zanoni
A novel fast and versatile temperature measurement system for LDMOS transistors. Microelectron. Reliab. 45 (9-11) (2005)