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Time-To-Latch-Up investigation of SCR devices as ESD protection structures on 65 nm technology platform.
Augusto Tazzoli
Martina Cordoni
Paolo Colombo
C. Bergonzoni
Gaudenzio Meneghesso
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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nm technology
power consumption
low power
mobile applications
real time
high density
mobile devices
computer vision
critical infrastructure
carbon nanotubes
communication infrastructure
control strategy
information security
access control
low cost
control system
information systems