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Enhancement of RF-MEMS switch reliability through an active anti-stiction heat-based mechanism.
Jacopo Iannacci
A. Repchankova
Alessandro Faes
Augusto Tazzoli
Gaudenzio Meneghesso
Gian-Franco Dalla Betta
Published in:
Microelectron. Reliab. (2010)
Keyphrases
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high speed
security protection
image processing
relevance feedback
selection mechanism
image enhancement
learning mechanism
search algorithm
reliability analysis
radio frequency
computational model
chemical reaction
failure rate
data sets
evolutionary algorithm
web services
databases