FAILURE RATE
Experts
- Saralees Nadarajah
- Liudong Xing
- Enrico Zio
- Rachid Guerraoui
- Srikanth Sastry
- Gregory Levitin
- Anthony A. Maciejewski
- Kishor S. Trivedi
- Petr Kuznetsov
- Zhenzhou Lu
- Yi-Kuei Lin
- Kaushik Roy
- Michel Raynal
- Eiji Oki
- Naohiro Hayashibara
- Michael G. Pecht
- Thomas Lange
- Shey-Huei Sheu
- Mikel Larrea
- Francky Catthoor
- Marco Dalai
- Frank P. A. Coolen
- János Tapolcai
- Rui Kang
- Jennifer L. Welch
- Dan Alexandrescu
- Arya Mazumdar
- Helmut Prodinger
- Antonio Fernández
- Giorgio Levi
- Kushagra Vaid
- Ying Chen
- Ruey Huei Yeh
- Franco Chiaraluce
- Xin Li
- Frederick T. Sheldon
- Michael Beigl
- Mehdi Baradaran Tahoori
- Sofiène Tahar
Venues
- CoRR
- Microelectron. Reliab.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Reliab.
- IEEE Trans. Inf. Theory
- IRPS
- Oper. Res.
- Qual. Reliab. Eng. Int.
- IEEE Access
- Eur. J. Oper. Res.
- ISIT
- Sensors
- Int. J. Syst. Assur. Eng. Manag.
- Comput. Ind. Eng.
- IEEE Trans. Computers
- ISSRE
- ICC
- IEEE Trans. Commun.
- ITC
- WSC
- DATE
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Very Large Scale Integr. Syst.
- Comput. Stat. Data Anal.
- IEEE Trans. Autom. Control.
- CDC
- DSN
- ACC
- IEEM
- Ann. Oper. Res.
- Oper. Res. Lett.
- HICSS
- Int. J. Syst. Sci.
- ICRA
- ISCAS
- J. Appl. Probab.
- J. Syst. Softw.
- Comput. Oper. Res.
- Commun. Stat. Simul. Comput.
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