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Experts
- Saralees Nadarajah
- Rachid Guerraoui
- Liudong Xing
- Enrico Zio
- Gregory Levitin
- Srikanth Sastry
- Kishor S. Trivedi
- Anthony A. Maciejewski
- Yi-Kuei Lin
- Zhenzhou Lu
- Petr Kuznetsov
- Shey-Huei Sheu
- Thomas Lange
- Naohiro Hayashibara
- Mikel Larrea
- Marco Dalai
- Eiji Oki
- Kaushik Roy
- Michael G. Pecht
- Michel Raynal
- Francky Catthoor
- Scott M. Pike
- Andreas Zeller
- Jörg Henkel
- Marco Baldi
- Frederick T. Sheldon
- Helmut Prodinger
- Mehdi Baradaran Tahoori
- Min Xie
- Andrey Povyakalo
- János Tapolcai
- Jennifer L. Welch
- Giorgio Levi
- Sébastien Tixeuil
- Nidhal Rezg
- Sofiène Tahar
- Kushagra Vaid
- Ruey Huei Yeh
- Franco Chiaraluce
Venues
- CoRR
- Microelectron. Reliab.
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Reliab.
- IEEE Trans. Inf. Theory
- IRPS
- Qual. Reliab. Eng. Int.
- Oper. Res.
- IEEE Access
- Eur. J. Oper. Res.
- Sensors
- ISIT
- Comput. Ind. Eng.
- Int. J. Syst. Assur. Eng. Manag.
- IEEE Trans. Computers
- ISSRE
- ICC
- IEEE Trans. Commun.
- ITC
- WSC
- DATE
- IEEE Trans. Very Large Scale Integr. Syst.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- Comput. Stat. Data Anal.
- IEEE Trans. Autom. Control.
- ACC
- DSN
- Entropy
- Ann. Oper. Res.
- CDC
- Oper. Res. Lett.
- IEEM
- Commun. Stat. Simul. Comput.
- J. Comput. Appl. Math.
- Int. J. Syst. Sci.
- ISCAS
- HICSS
- ICRA
- J. Appl. Probab.
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