Claudio Lanzieri

Publication Activity (10 Years)

Years Active: 2008-2015
Publications (10 Years): 1

Top Topics

Equivalent Circuit

Search Strategies

Highly Reliable

Top Venues

Microelectron. Reliab.

Publications

Davide Bisi, Antonio Stocco, Isabella Rossetto, Matteo Meneghini, Fabiana Rampazzo, Alessandro Chini, Fabio Soci, Alessio Pantellini, Claudio Lanzieri, Piero Gamarra, Cedric Lacam, M. Tordjman, Marie-Antoinette di Forte-Poisson, Davide De Salvador, Marco Bazzan, Gaudenzio Meneghesso, Enrico Zanoni
Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs. Microelectron. Reliab. 55 (9-10) (2015)
Alessandro Chini, Gaudenzio Meneghesso, Alessio Pantellini, Claudio Lanzieri, Enrico Zanoni
Reliability Investigation of GaN HEMTs for MMICs Applications. Micromachines 5 (3) (2014)
Davide Bisi, Matteo Meneghini, Antonio Stocco, Giulia Cibin, Alessio Pantellini, Antonio Nanni, Claudio Lanzieri, Enrico Zanoni, Gaudenzio Meneghesso
Influence of fluorine-based dry etching on electrical parameters of AlGaN/GaN-on-Si High Electron Mobility Transistors. ESSDERC (2013)
Alessandro Chini, Fabio Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni
Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs. Microelectron. Reliab. 53 (9-11) (2013)
Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni
Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectron. Reliab. 52 (9-10) (2012)
Michele Riccio, A. Pantellini, Andrea Irace, Giovanni Breglio, A. Nanni, Claudio Lanzieri
Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology. Microelectron. Reliab. 51 (9-11) (2011)
Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini
Thermal storage effects on AlGaN/GaN HEMT. Microelectron. Reliab. 48 (8-9) (2008)