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Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology.
Michele Riccio
A. Pantellini
Andrea Irace
Giovanni Breglio
A. Nanni
Claudio Lanzieri
Published in:
Microelectron. Reliab. (2011)
Keyphrases
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microstrip
small size
edge detection
image processing
infrared
image analysis
multiresolution
denoising
single image
pose estimation
dual band