EDGE DETECTION
Experts
- Yang Liu
- Marc Moonen
- Luc Van Gool
- Jacob Benesty
- Dinggang Shen
- Schahram Dustdar
- Isabelle Bloch
- Wei Wang
- Licheng Jiao
- Chin-Chen Chang
- Sos S. Agaian
- Lei Zhang
- Jun Zhang
- Wei Zhang
- Wei Liu
- Yi Wang
- Yu Zhang
- Wilfried Philips
- Wen Gao
- Radu Timofte
- Lei Wang
- Nassir Navab
- Yan Wang
- Simon Doclo
- Alan C. Bovik
- Pheng-Ann Heng
- Jing Wang
- Jian Zhang
- J. Alison Noble
- Xin Wang
- Jiebo Luo
- Nasir M. Rajpoot
- Xinbo Gao
- Thomas S. Huang
- Xiaolong Xu
- Wei Li
- Tao Wang
- H. Vincent Poor
- Dusit Niyato
Venues
- CoRR
- IEEE Access
- ICASSP
- IGARSS
- ICIP
- Sensors
- Remote. Sens.
- Multim. Tools Appl.
- IEEE Trans. Image Process.
- IEEE Trans. Geosci. Remote. Sens.
- CVPR
- EUSIPCO
- Pattern Recognit.
- EMBC
- J. Comput. Phys.
- ISBI
- Appl. Math. Comput.
- IEEE Geosci. Remote. Sens. Lett.
- Pattern Recognit. Lett.
- ICPR
- ISCAS
- Signal Process.
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Medical Imaging: Image Processing
- IEEE Trans. Medical Imaging
- Neurocomputing
- Discret. Math.
- IEEE Trans. Signal Process.
- ICCV
- J. Electronic Imaging
- IET Image Process.
- IEEE Internet Things J.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- NeuroImage
- INTERSPEECH
- IEEE Signal Process. Lett.
- IEEE Trans. Commun.
- GLOBECOM
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