Fausto Fantini

Publication Activity (10 Years)

Years Active: 1990-2013
Publications (10 Years): 0

Top Topics

Highly Reliable

Mathematical Morphology

Top Venues

Microelectron. Reliab.

Publications

Alessandro Chini, Fabio Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni
Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs. Microelectron. Reliab. 53 (9-11) (2013)
Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni
Field plate related reliability improvements in GaN-on-Si HEMTs. Microelectron. Reliab. 52 (9-10) (2012)
Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Benoit Lambert, Giovanni Verzellesi, Fausto Fantini
Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations. Microelectron. Reliab. 50 (9-11) (2010)
Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress. Microelectron. Reliab. 50 (9-11) (2010)
Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Sulfur-contamination of high power white LED. Microelectron. Reliab. 48 (8-9) (2008)
Mustapha Faqir, Giovanni Verzellesi, Fausto Fantini, Francesca Danesin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua
Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs. Microelectron. Reliab. 47 (9-11) (2007)
G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano
Failure Analysis-assisted FMEA. Microelectron. Reliab. 46 (9-11) (2006)
G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45 (9-11) (2005)
Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi
Thick Film Chip Resistors. Microelectron. Reliab. 44 (9-11) (2004)
J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectron. Reliab. 43 (9-11) (2003)
G. Cassanelli, Fausto Fantini, G. Serra, S. Sgatti
Reliability in automotive electronics: a case study applied to diesel engine control. Microelectron. Reliab. 43 (9-11) (2003)
Fausto Fantini, Massimo Vanzi
Editorial. Microelectron. Reliab. 42 (9-11) (2002)
V. Lista, P. Garbossa, T. Tomasi, Mattia Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications. Microelectron. Reliab. 42 (9-11) (2002)
Mattia Borgarino, Roberto Menozzi, D. Dieci, L. Cattani, Fausto Fantini
Reliability physics of compound semiconductor transistors for microwave applications. Microelectron. Reliab. 41 (1) (2001)
Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi
VLSI reliability: Contributions from a three year national research program. Eur. Trans. Telecommun. 1 (2) (1990)