Login / Signup

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations.

Mustapha FaqirMohsine BouyaNathalie MalbertNathalie LabatD. CarisettiBenoit LambertGiovanni VerzellesiFausto Fantini
Published in: Microelectron. Reliab. (2010)
Keyphrases
  • numerical simulations
  • theoretical analysis
  • neural network
  • data analysis
  • image analysis
  • future development