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Reliability physics of compound semiconductor transistors for microwave applications.
Mattia Borgarino
Roberto Menozzi
D. Dieci
L. Cattani
Fausto Fantini
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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power consumption
computer science
high density
field effect transistors
low power
semiconductor manufacturing
highly reliable
quantum mechanics
genetic algorithm
information systems
failure rate
circuit design
reliability analysis
gallium arsenide