Roberto Menozzi

Publication Activity (10 Years)

Years Active: 1990-2023
Publications (10 Years): 4

Top Topics

University Campus

Neural Network Ensemble

Electric Vehicles

Fleet Management

Top Venues

Microelectron. Reliab.

Publications

Paolo Cova, Nicola Delmonte, Stefano Ferrari, Massimo Lazzaroni, Roberto Menozzi, Danilo Santoro, Marco Simonazzi
Electrical Vehicle Fleet Management for Industrial Environment with Battery SoH Prediction Through Neural Networks. MetroXRAINE (2023)
Marco Simonazzi, Nicola Delmonte, Paolo Cova, Gianluigi Ferrari, Francesco Zanichelli, Roberto Menozzi
Modeling of a university campus Micro-Grid for optimal planning of renewable generation and storage deployment. ISC2 (2021)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 83 (2018)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 68 (2017)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 55 (12) (2015)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 54 (12) (2014)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 54 (2) (2014)
Francesco Giuliani, Nicola Delmonte, Paolo Cova, Roberto Menozzi
Temperature-dependent reverse-bias stress of normally-off GaN power FETs. Microelectron. Reliab. 53 (9-11) (2013)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 52 (1) (2012)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 52 (12) (2012)
D. Mari, Mirko Bernardoni, Giovanna Sozzi, Roberto Menozzi, G. A. Umana-Membreno, Brett D. Nener
A physical large-signal model for GaN HEMTS including self-heating and trap-related dispersion. Microelectron. Reliab. 51 (2) (2011)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 51 (2) (2011)
Antonio Raffo, Sergio Di Falco, Giovanna Sozzi, Roberto Menozzi, Dominique M. M.-P. Schreurs, Giorgio Vannini
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime. Microelectron. Reliab. 51 (2) (2011)
Paolo Cova, Mirko Bernardoni, Nicola Delmonte, Roberto Menozzi
Dynamic electro-thermal modeling for power device assemblies. Microelectron. Reliab. 51 (9-11) (2011)
Mirko Bernardoni, Nicola Delmonte, Paolo Cova, Roberto Menozzi
Thermal modeling of planar transformer for switching power converters. Microelectron. Reliab. 50 (9-11) (2010)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 50 (6) (2010)
Mirko Bernardoni, Paolo Cova, Nicola Delmonte, Roberto Menozzi
Heat management for power converters in sealed enclosures: A numerical study. Microelectron. Reliab. 49 (9-11) (2009)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 49 (5) (2009)
Fulvio Bertoluzza, Nicola Delmonte, Roberto Menozzi
Three-dimensional finite-element thermal simulation of GaN-based HEMTs. Microelectron. Reliab. 49 (5) (2009)
Paolo Cova, Nicola Delmonte, Roberto Menozzi
Thermal modeling of high frequency DC-DC switching modules: Electromagnetic and thermal simulation of magnetic components. Microelectron. Reliab. 48 (8-9) (2008)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 48 (7) (2008)
Federico Alimenti, Domenico Zito, Andrea Boni, Mattia Borgarino, Alessandro Fonte, Alessandro Carboni, Salvatore Leone, Marco Pifferi, Luca Roselli, Bruno Neri, Roberto Menozzi
System-on-chip microwave radiometer for thermal remote sensing and its application to the forest fire detection. ICECS (2008)
Giovanna Sozzi, Roberto Menozzi
A review of the use of electro-thermal simulations for the analysis of heterostructure FETs. Microelectron. Reliab. 47 (1) (2007)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 47 (8) (2007)
Nicola Delmonte, B. E. Watts, Giovanni Chiorboli, Paolo Cova, Roberto Menozzi
Test structures for dielectric spectroscopy of thin films at microwave frequencies. Microelectron. Reliab. 47 (4-5) (2007)
Paolo Cova, Nicola Delmonte, Roberto Menozzi
Thermal characterization and modeling of power hybrid converters for distributed power systems. Microelectron. Reliab. 46 (9-11) (2006)
Paolo Cova, Roberto Menozzi, Marco Portesine
Experimental and numerical study of the recovery softness and overvoltage dependence on p-i-n diode design. Microelectron. J. 37 (5) (2006)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 46 (8) (2006)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 45 (12) (2005)
Paolo Cova, Nicola Delmonte, Roberto Menozzi
On state breakdown in PHEMTs and its temperature dependence. Microelectron. Reliab. 45 (9-11) (2005)
Paolo Cova, Nicola Delmonte, Giovanna Sozzi, Roberto Menozzi
Temperature-dependent breakdown and hot carrier stress of PHEMTs. Microelectron. Reliab. 44 (9-11) (2004)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 44 (7) (2004)
Paolo Cova, Roberto Menozzi, Marco Portesine
irradiation for soft and reliable reverse recovery. Microelectron. Reliab. 43 (1) (2003)
Wallace T. Anderson, Roberto Menozzi
Editorial. Microelectron. Reliab. 43 (6) (2003)
Giovanna Sozzi, Roberto Menozzi
High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study. Microelectron. Reliab. 42 (1) (2002)
Paolo Cova, Roberto Menozzi, Maximilian Dammann, T. Feltgen, W. Jantz
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. Microelectron. Reliab. 42 (9-11) (2002)
Wallace T. Anderson, Roberto Menozzi
Editorial. Microelectron. Reliab. 42 (7) (2002)
Mattia Borgarino, Roberto Menozzi, D. Dieci, L. Cattani, Fausto Fantini
Reliability physics of compound semiconductor transistors for microwave applications. Microelectron. Reliab. 41 (1) (2001)
Wallace T. Anderson, Roberto Menozzi
Editorial. Microelectron. Reliab. 41 (8) (2001)
Massimo Lanzoni, Roberto Menozzi, Piero Olivo, Bruno Riccò, Andrea Haardt
PROM aging and endurance: A case study. Eur. Trans. Telecommun. 1 (2) (1990)
Roberto Menozzi, Mattia Lanzoni, Luca Selmi, Bruno Riccò
An improved procedure to test CMOS ICs for latch-up. ITC (1990)