Giovanni Chiorboli

Publication Activity (10 Years)

Years Active: 1994-2024
Publications (10 Years): 7

Top Topics

Consumer Electronics

Top Venues

MetroInd4.0&IoT

IEEE Trans. Consumer Electron.

IEEE Trans. Instrum. Meas.

Publications

Giovanna Sozzi, Sergio Sapienza, Giovanni Chiorboli, Lasse Vines, Anders Hallén, Roberta Nipoti
Carrier Lifetime Dependence on Temperature and Proton Irradiation in 4H-SiC Device: An Experimental Law. IEEE Access 12 (2024)
Danilo Santoro, Giovanni Chiorboli, Marco Bassani, Alessandro Andreani, Paolo Cova, Nicola Delmonte, Massimo Lazzaroni, Andrea Riminucci, Valeria Trabattoni, Andrea Zani
Operational Amplifier Characterization at Cryogenic Temperatures. I2MTC (2024)
Sadia Ali, Mattia Stighezza, Giovanni Chiorboli, Ilaria De Munari, Valentina Bianchi
An Optimized Long Short Term Memory and Gaussian Process Regression Based Framework for State of Charge Estimation. MetroAutomotive (2024)
Valentina Bianchi, Mattia Stighezza, Andrea Toscani, Giovanni Chiorboli, Ilaria De Munari
An Improved Method Based on Support Vector Regression With Application Independent Training for State of Charge Estimation. IEEE Trans. Instrum. Meas. 72 (2023)
Daniel Pinardi, Nicholas Rocchi, Andrea Toscani, Marco Binelli, Giovanni Chiorboli, Angelo Farina, Luca Cattani
An Innovative Architecture of Full-Digital Microphone Arrays Over A²B Network for Consumer Electronics. IEEE Trans. Consumer Electron. 68 (3) (2022)
Niccolò Mora, Federico Cocconcelli, Guido Matrella, Giovanni Chiorboli, Paolo Ciampolini
An accurate and stable bed-based ballistocardiogram measurement and analysis system. MetroInd4.0&IoT (2021)
N. Rocchi, Andrea Toscani, Giovanni Chiorboli, D. Pinardi, M. Binelli, Angelo Farina
Transducer Arrays Over A²B Networks in Industrial and Automotive Applications: Clock Propagation Measurements. IEEE Access 9 (2021)
Cristiano Azzolini, Alessandro Magnanini, Matteo Tonelli, Giovanni Chiorboli, Carlo Morandi
A CMOS vector lock-in amplifier for sensor applications. Microelectron. J. 41 (8) (2010)
Andrea Boni, Cristiano Azzolini, Davide Vecchi, Giovanni Chiorboli
Single-Reference Foreground Calibration of High-Resolution, High-Speed Pipeline ADCs. Circuits Syst. Signal Process. 28 (4) (2009)
Nicola Delmonte, B. E. Watts, Giovanni Chiorboli, Paolo Cova, Roberto Menozzi
Test structures for dielectric spectroscopy of thin films at microwave frequencies. Microelectron. Reliab. 47 (4-5) (2007)
Giovanni Chiorboli, Silvia Dondi, Carlo Morandi, Davide Vecchi
DAC calibration by weighting capacitor rotation in a pipelined ADC. Circuits, Signals, and Systems (2005)
Giovanni Chiorboli
Uncertainty of mean value and variance obtained from quantized data. IEEE Trans. Instrum. Meas. 52 (4) (2003)
Giovanni Chiorboli
Sub-picosecond aperture-uncertainty measurements [ADCs]. IEEE Trans. Instrum. Meas. 51 (5) (2002)
Paolo Carbone, Giovanni Chiorboli
ADC sinewave histogram testing with quasi-coherent sampling. IEEE Trans. Instrum. Meas. 50 (4) (2001)
Giovanni Chiorboli, Massimo Fontanili
Cross-correlation noise measurements in A/D converters. IEEE Trans. Instrum. Meas. 48 (6) (1999)
Giovanni Chiorboli, Massimo Fontanili, Carlo Morandi
A new method for estimating the aperture uncertainty of A/D converters. IEEE Trans. Instrum. Meas. 47 (1) (1998)
Giovanni Chiorboli, Barbara De Salvo, Giovanni Franco, Carlo Morandi
Some thoughts on the word error rate measurement of A/D converters. ICECS (1998)
Andrea Boni, Giovanni Chiorboli, G. Franco, M. Ostacoli, S. Mazzoleni
Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm. J. Electron. Test. 7 (3) (1995)
Andrea Boni, Giovanni Chiorboli, G. Franco, S. Mazzoleni, M. Ostacoli
Physical Modeling of Linearity Errors for the Diagnosis of High Resolution R-2R D/A Converters. EDAC-ETC-EUROASIC (1994)