Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm.
Andrea BoniGiovanni ChiorboliG. FrancoM. OstacoliS. MazzoleniPublished in: J. Electron. Test. (1995)
Keyphrases
- cost function
- times faster
- learning algorithm
- detection algorithm
- computational cost
- experimental evaluation
- expectation maximization
- high accuracy
- optimization algorithm
- estimation algorithm
- k means
- selection algorithm
- computationally efficient
- linear programming
- single pass
- improved algorithm
- classification algorithm
- clustering method
- computational complexity
- probabilistic model
- preprocessing
- dynamic programming
- search space
- optical flow
- genetic algorithm
- significant improvement
- np hard
- recognition algorithm
- convergence rate
- convex hull
- similarity measure
- matching algorithm
- rate distortion
- mobile robot
- optimal solution
- search algorithm
- worst case
- simulated annealing