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Carrier Lifetime Dependence on Temperature and Proton Irradiation in 4H-SiC Device: An Experimental Law.

Giovanna SozziSergio SapienzaGiovanni ChiorboliLasse VinesAnders HallénRoberta Nipoti
Published in: IEEE Access (2024)
Keyphrases
  • monte carlo simulation
  • room temperature
  • high temperature
  • life span
  • fuel cell
  • energy consumption
  • electron beam
  • case law
  • bayesian networks
  • markov chain
  • input device
  • electric field
  • portable devices