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Experts
- Jijun Xiong
- Kofi A. A. Makinwa
- Emiliano Schena
- Paola Saccomandi
- Dong Sam Ha
- Mohamad Sawan
- David T. Blaauw
- Hei Wong
- Zhuangde Jiang
- Ahmad Hassan
- Carlo Massaroni
- Yvon Savaria
- Dennis Sylvester
- Ting Liang
- Anna G. Stefanopoulou
- Ying-ping Hong
- Pinggang Jia
- Luigi del Re
- Daniele Tosi
- Sheldon X.-D. Tan
- Jae-Yoon Sim
- Qiulin Tan
- Chenyang Xue
- Chen Li
- Tajana Simunic Rosing
- J. T. Winowlin Jappes
- Kevin Skadron
- Mircea R. Stan
- Stefania Campopiano
- Joseph Shor
- Yue-Yun Wang
- Agostino Iadicicco
- Kamran Souri
- Fariborz Lohrabi Pour
- Qiu-lin Tan
- Jie Yang
- Zoubir Khatir
- Gang Quan
- Nicolas Petit
Venues
- Sensors
- Microelectron. Reliab.
- CoRR
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Microelectron. J.
- IGARSS
- NEMS
- ISCAS
- IEEE SENSORS
- ACC
- Symmetry
- Remote. Sens.
- IEICE Trans. Electron.
- EMBC
- J. Vis.
- Entropy
- IEEE J. Solid State Circuits
- IEEE Trans. Ind. Electron.
- IEEE Trans. Geosci. Remote. Sens.
- J. Comput. Chem.
- IEICE Electron. Express
- OFC
- J. Sensors
- IEEE Trans. Very Large Scale Integr. Syst.
- ISSCC
- I2MTC
- IRPS
- IAS
- ECC
- IEEE Trans. Biomed. Eng.
- CICC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IECON
- IEEE Trans. Circuits Syst. II Express Briefs
- Appl. Math. Comput.
- DATE
- MWSCAS
- Proc. IEEE
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