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Experts
- Jijun Xiong
- Kofi A. A. Makinwa
- Emiliano Schena
- Paola Saccomandi
- Mohamad Sawan
- Dong Sam Ha
- David T. Blaauw
- Hei Wong
- Carlo Massaroni
- Ahmad Hassan
- Dennis Sylvester
- Yvon Savaria
- Zhuangde Jiang
- Luigi del Re
- Pinggang Jia
- Anna G. Stefanopoulou
- Ting Liang
- Ying-ping Hong
- Daniele Tosi
- Jae-Yoon Sim
- Chen Li
- Sheldon X.-D. Tan
- Qiulin Tan
- Chenyang Xue
- Kevin Skadron
- Chi-Wah Kok
- Jie Yang
- Yang Liu
- J. T. Winowlin Jappes
- Tajana Simunic Rosing
- Zoubir Khatir
- Qiu-lin Tan
- Mircea R. Stan
- Wendong Zhang
- Guo-Quan Lu
- Yue-Yun Wang
- Stefania Campopiano
- Gang Quan
- Fariborz Lohrabi Pour
Venues
- Sensors
- Microelectron. Reliab.
- CoRR
- IEEE Access
- IEEE Trans. Instrum. Meas.
- Microelectron. J.
- IGARSS
- NEMS
- ISCAS
- ACC
- IEEE SENSORS
- Symmetry
- Remote. Sens.
- EMBC
- IEICE Trans. Electron.
- J. Vis.
- Entropy
- IEEE Trans. Ind. Electron.
- IEEE J. Solid State Circuits
- J. Comput. Chem.
- IEEE Trans. Geosci. Remote. Sens.
- IEICE Electron. Express
- OFC
- J. Sensors
- IEEE Trans. Very Large Scale Integr. Syst.
- ISSCC
- IAS
- IRPS
- I2MTC
- ECC
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IECON
- CICC
- IEEE Trans. Circuits Syst. II Express Briefs
- Appl. Math. Comput.
- DATE
- MWSCAS
- Proc. IEEE
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