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Experts
- Dror Rawitz
- Hui Wu
- Peter Terlecky
- Amotz Bar-Noy
- Luiz A. DaSilva
- Jihong Kim
- Chun Jason Xue
- Wei-Tsung Chang
- Myungsuk Kim
- A. Robert Calderbank
- Marco Listanti
- Luca Chiaraviglio
- Zhu Han
- Wenguang Zheng
- Tian He
- Samy S. Soliman
- Pavel Hazdra
- Hemangee K. Kapoor
- Jingjing Fei
- Lunkai Zhang
- Sheldon X.-D. Tan
- Frederic T. Chong
- Cristiana Bolchini
- Shu-Fei Wu
- Pradip Bose
- Antonio Miele
- Dayu He
- Raffaele Cerulli
- Masoud Ardakani
- Zhifang Liao
- Zhiyi Yu
- Tulika Mitra
- Kang Eun Jeon
- Akinobu Teramoto
- Fuu-Cheng Jiang
- C.-C. Jay Kuo
- Haozhi Jin
- James She
- Scott S. Howard
Venues
- CoRR
- Microelectron. Reliab.
- IEEE Access
- Sensors
- Reliab. Eng. Syst. Saf.
- DATE
- CHI Extended Abstracts
- Int. J. Distributed Sens. Networks
- IEEE Trans. Reliab.
- DAC
- NeuroImage
- ICC
- Microelectron. J.
- ICCD
- ISPD
- Commun. Stat. Simul. Comput.
- DSN
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- FAST
- CogSci
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IECON
- IEEE Commun. Lett.
- Eur. J. Oper. Res.
- WCNC
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- Hum. Factors
- Wirel. Pers. Commun.
- SIGGRAPH Awards
- IEEE/ACM Trans. Netw.
- Symmetry
- IEICE Electron. Express
- IPDPS
- ISCAS
- AAAI
- IEEE Internet Things J.
- IRPS
- Math. Comput. Simul.
- Scientometrics
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