Taeyoung Kim

Publication Activity (10 Years)

Years Active: 2006-2019
Publications (10 Years): 19

Top Topics

Sensor Networks

Sample Selection

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Zeyu Sun, Taeyoung Kim, Marcus Chow, Shaoyi Peng, Han Zhou, Hyoseung Kim, Daniel Wong, Sheldon X.-D. Tan
Long-Term Reliability Management For Multitasking GPGPUs. SMACD (2019)
Shengcheng Wang, Taeyoung Kim, Zeyu Sun, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori
Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICs. IEEE Trans. Very Large Scale Integr. Syst. 26 (3) (2018)
Taeyoung Kim, Sheldon X.-D. Tan, Chase Cook, Zeyu Sun
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. Integr. 63 (2018)
Shaoyi Peng, Han Zhou, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan
Physics-Based Compact TDDB Models for Low-k BEOL Copper Interconnects With Time-Varying Voltage Stressing. IEEE Trans. Very Large Scale Integr. Syst. 26 (2) (2018)
Taeyoung Kim, Zao Liu, Sheldon X.-D. Tan
Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors. Microelectron. J. 74 (2018)
Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel
Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integr. 60 (2018)
Taeyoung Kim, Zeyu Sun, Hai-Bao Chen, Hai Wang, Sheldon X.-D. Tan
Energy and Lifetime Optimizations for Dark Silicon Manycore Microprocessor Considering Both Hard and Soft Errors. IEEE Trans. Very Large Scale Integr. Syst. 25 (9) (2017)
Xin Huang, Valeriy Sukharev, Taeyoung Kim, Sheldon X.-D. Tan
Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing. Integr. 58 (2017)
Yaoyao Ye, Taeyoung Kim, Hai-Bao Chen, Hai Wang, Esteban Tlelo-Cuautle, Sheldon X.-D. Tan
Comprehensive detection of counterfeit ICs via on-chip sensor and post-fabrication authentication policy. SMACD (2017)
Xin Huang, Valeriy Sukharev, Jun-Ho Choy, Marko Chew, Taeyoung Kim, Sheldon X.-D. Tan
Electromigration assessment for power grid networks considering temperature and thermal stress effects. Integr. 55 (2016)
Chase Cook, Zeyu Sun, Taeyoung Kim, Sheldon X.-D. Tan
Finite difference method for electromigration analysis of multi-branch interconnects. SMACD (2016)
Yue Zhao, Taeyoung Kim, Hosoon Shin, Sheldon X.-D. Tan, Xin Li, Hai-Bao Chen, Hai Wang
Statistical Rare-Event Analysis and Parameter Guidance by Elite Learning Sample Selection. ACM Trans. Design Autom. Electr. Syst. 21 (4) (2016)
Taeyoung Kim, Zeyu Sun, Chase Cook, Hengyang Zhao, Ruiwen Li, Daniel Wong, Sheldon X.-D. Tan
Invited - Cross-layer modeling and optimization for electromigration induced reliability. DAC (2016)
Xin Huang, Valeriy Sukharev, Zhongdong Qi, Taeyoung Kim, Sheldon X.-D. Tan
Physics-based full-chip TDDB assessment for BEOL interconnects. DAC (2016)
Taeyoung Kim, Xin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan
Learning-based dynamic reliability management for dark silicon processor considering EM effects. DATE (2016)
Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan
Voltage-based electromigration immortality check for general multi-branch interconnects. ICCAD (2016)
Xin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan
Electromigration recovery modeling and analysis under time-dependent current and temperature stressing. ASP-DAC (2016)
Hai-Bao Chen, Sheldon X.-D. Tan, Xin Huang, Taeyoung Kim, Valeriy Sukharev
Analytical Modeling and Characterization of Electromigration Effects for Multibranch Interconnect Trees. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 35 (11) (2016)
Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan
Dynamic reliability management for near-threshold dark silicon processors. ICCAD (2016)
Hai-Bao Chen, Sheldon X.-D. Tan, Valeriy Sukharev, Xin Huang, Taeyoung Kim
Interconnect reliability modeling and analysis for multi-branch interconnect trees. DAC (2015)
Taeyoung Kim, Bowen Zheng, Hai-Bao Chen, Qi Zhu, Valeriy Sukharev, Sheldon X.-D. Tan
Lifetime optimization for real-time embedded systems considering electromigration effects. ICCAD (2014)
Tianshu Wei, Taeyoung Kim, Sangyoung Park, Qi Zhu, Sheldon X.-D. Tan, Naehyuck Chang, Sadrul Ula, Mehdi Maasoumy
Battery Management and Application for Energy-Efficient Buildings. DAC (2014)
Shanshan Chen, Jeff S. Brantley, Taeyoung Kim, Samuel A. Ridenour, John C. Lach
Characterising and minimising sources of error in inertial body sensor networks. Int. J. Auton. Adapt. Commun. Syst. 6 (3) (2013)
Woo-Yong Lee, Kyeong Hur, Taeyoung Kim, Doo Seop Eom, Jong-Ok Kim
Large Scale Indoor Localization System Based on Wireless Sensor Networks for Ubiquitous Computing. Wirel. Pers. Commun. 63 (1) (2012)
Taeyoung Kim, Shanshan Chen, John C. Lach
Detecting and Preventing Forward Head Posture with Wireless Inertial Body Sensor Networks. BSN (2011)
Adam T. Barth, Benjamin Boudaoud, Jeff S. Brantley, Shanshan Chen, Christopher L. Cunningham, Taeyoung Kim, Harry C. Powell Jr., Samuel A. Ridenour, John C. Lach, Bradford C. Bennett
Longitudinal high-fidelity gait analysis with wireless inertial body sensors. Wireless Health (2010)
Shanshan Chen, Jeff S. Brantley, Taeyoung Kim, John C. Lach
Characterizing and minimizing synchronization and calibration errors in inertial body sensor networks. BODYNETS (2010)
HyunHo Jee, Doo Seop Eom, Taeyoung Kim, HunKi Park, Hyoil Lee, JungHyun Han
Multi-player VR game built upon wireless sensor network. ICUIMC (2008)
Doo Seop Eom, Taeyoung Kim, HyunHo Jee, Hyoil Lee, JungHyun Han
A multi-player arcade video game platform with a wireless tangible user interface. IEEE Trans. Consumer Electron. 54 (4) (2008)
Kwang-il Hwang, Taeyoung Kim, Doo Seop Eom
Proactive Data Delivery Scheme with Optimal Path for Dynamic Sensor Networks. UIC (2007)
Doo Seop Eom, Jungshik Jang, Taeyoung Kim, JungHyun Han
A VR Game Platform Built Upon Wireless Sensor Network. ISVC (2) (2006)