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Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).
Sheldon X.-D. Tan
Hussam Amrouch
Taeyoung Kim
Zeyu Sun
Chase Cook
Jörg Henkel
Published in:
Integr. (2018)
Keyphrases
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recent advances
researchers and practitioners
probabilistic model
decision trees
data analysis
recent developments
machine learning
feature space
maximum likelihood
expectation maximization
em algorithm
generative model
field of pattern recognition