Chase Cook

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 14

Top Topics

Graph Partitioning

Automatic Analysis

Combinatorial Optimization Problems

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

Publications

Xiaoyi Wang, Shaobin Ma, Sheldon X.-D. Tan, Chase Cook, Liang Chen, Jianlei Yang, Wenjian Yu
Fast Physics-Based Electromigration Analysis for Full-Chip Networks by Efficient Eigenfunction-Based Solution. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40 (3) (2021)
Chase Cook, Wentian Jin, Sheldon X.-D. Tan
GPU-based Ising Computing for Solving Balanced Min-Cut Graph Partitioning Problem. CoRR (2019)
Chase Cook, Hengyang Zhao, Takashi Sato, Masayuki Hiromoto, Sheldon X.-D. Tan
GPU-based Ising computing for solving max-cut combinatorial optimization problems. Integr. 69 (2019)
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
Reliability based hardware Trojan design using physics-based electromigration models. Integr. 66 (2019)
Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Chase Cook, Sheldon X.-D. Tan
Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37 (12) (2018)
Taeyoung Kim, Sheldon X.-D. Tan, Chase Cook, Zeyu Sun
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy. Integr. 63 (2018)
Sheriff Sadiqbatcha, Chase Cook, Zeyu Sun, Sheldon X.-D. Tan
Accelerating Electromigration Wear-Out Effects Based on Configurable Sink-Structured Wires. SMACD (2018)
Chase Cook, Sheriff Sadiqbatcha, Zeyu Sun, Sheldon X.-D. Tan
Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models. SMACD (2018)
Sheldon X.-D. Tan, Hussam Amrouch, Taeyoung Kim, Zeyu Sun, Chase Cook, Jörg Henkel
Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). Integr. 60 (2018)
Chase Cook, Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Sheldon X.-D. Tan
Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method. IEEE Trans. Very Large Scale Integr. Syst. 26 (5) (2018)
Xiaoyi Wang, Yan Yan, Jian He, Sheldon X.-D. Tan, Chase Cook, Shengqi Yang
Fast physics-based electromigration analysis for multi-branch interconnect trees. ICCAD (2017)
Chase Cook, Zeyu Sun, Taeyoung Kim, Sheldon X.-D. Tan
Finite difference method for electromigration analysis of multi-branch interconnects. SMACD (2016)
Taeyoung Kim, Zeyu Sun, Chase Cook, Hengyang Zhao, Ruiwen Li, Daniel Wong, Sheldon X.-D. Tan
Invited - Cross-layer modeling and optimization for electromigration induced reliability. DAC (2016)
Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan
Dynamic reliability management for near-threshold dark silicon processors. ICCAD (2016)