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Dynamic reliability management for near-threshold dark silicon processors.
Taeyoung Kim
Zeyu Sun
Chase Cook
Jagadeesh Gaddipati
Hai Wang
Hai-Bao Chen
Sheldon X.-D. Tan
Published in:
ICCAD (2016)
Keyphrases
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management system
parallel processing
low cost
data processing
network management
high speed
parallel algorithm
data management
decision support
dynamic environments
project management
high density
highly reliable