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Fast Electromigration Immortality Analysis for Multisegment Copper Interconnect Wires.

Zeyu SunErtugrul DemircanMehul D. ShroffChase CookSheldon X.-D. Tan
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2018)
Keyphrases
  • statistical analysis
  • real time
  • databases
  • face recognition
  • genetic algorithm
  • decision trees
  • data analysis
  • lower bound
  • image analysis
  • automatic analysis