Learning-based dynamic reliability management for dark silicon processor considering EM effects.
Taeyoung KimXin HuangHai-Bao ChenValeriy SukharevSheldon X.-D. TanPublished in: DATE (2016)
Keyphrases
- computer based instruction
- learning process
- learning algorithm
- high speed
- learning systems
- reinforcement learning
- online learning
- supervised learning
- decision support
- knowledge acquisition
- mobile devices
- information systems
- knowledge management
- management system
- maximum likelihood
- active learning
- image segmentation