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Physics-Based Compact TDDB Models for Low-k BEOL Copper Interconnects With Time-Varying Voltage Stressing.

Shaoyi PengHan ZhouTaeyoung KimHai-Bao ChenSheldon X.-D. Tan
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
  • probabilistic model
  • neural network
  • prior knowledge
  • x ray
  • mathematical models
  • fiber optic