Login / Signup
Voltage-based electromigration immortality check for general multi-branch interconnects.
Zeyu Sun
Ertugrul Demircan
Mehul D. Shroff
Taeyoung Kim
Xin Huang
Sheldon X.-D. Tan
Published in:
ICCAD (2016)
Keyphrases
</>
special case
input output
closely related
data mining
evolutionary algorithm
signal processing