Sub-picosecond aperture-uncertainty measurements [ADCs].
Giovanni ChiorboliPublished in: IEEE Trans. Instrum. Meas. (2002)
Keyphrases
- expert systems
- measurement noise
- measurement errors
- measurement error
- uncertain data
- integrated circuit
- imaging systems
- measurement data
- inherent uncertainty
- machine learning
- belief functions
- evolutionary algorithm
- expected utility
- measured data
- uncertain information
- information systems
- learning algorithm
- sensor measurements
- data mining
- databases