Peter Ersland

Publication Activity (10 Years)

Years Active: 2003-2018
Publications (10 Years): 2

Top Topics

Information Retrieval

Gallium Arsenide

Top Venues

Microelectron. Reliab.

Publications

Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 83 (2018)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 68 (2017)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 55 (12) (2015)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 54 (12) (2014)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 54 (2) (2014)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 52 (1) (2012)
Peter Ersland, Shivarajiv Somisetty
Reliability validation of compound semiconductor foundry processes. Microelectron. Reliab. 52 (9-10) (2012)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 52 (12) (2012)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 51 (2) (2011)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 50 (6) (2010)
C. Gil, Peter Ersland, A. Li
Determining DC/RF survivability limits of GaAs semiconductor circuits. Microelectron. Reliab. 49 (5) (2009)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 49 (5) (2009)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 48 (7) (2008)
Samson Mil'shtein, Peter Ersland
Progress of quantum electronics and the future of wireless technologies. Microelectron. J. 39 (3-4) (2008)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 47 (8) (2007)
Shivarajiv Somisetty, Peter Ersland, Xinxing Yang, Jason Barrett
Reliability investigation and characterization of failure modes in Schottky diodes. Microelectron. Reliab. 46 (8) (2006)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 46 (8) (2006)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 45 (12) (2005)
Samson Mil'shtein, C. Gil, Peter Ersland
Heterojunction semiconductor triode - a new vertical device. Microelectron. J. 36 (3-6) (2005)
Peter Ersland, Roberto Menozzi
Editorial. Microelectron. Reliab. 44 (7) (2004)
Peter Ersland, Hei-Ruey Jen, Xinxing Yang
Lifetime acceleration model for HAST tests of a pHEMT process. Microelectron. Reliab. 44 (7) (2004)
Samson Mil'shtein, Peter Ersland, Shivarajiv Somisetty, C. Gil
p-HEMT with tailored field. Microelectron. J. 34 (5-8) (2003)