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Reliability validation of compound semiconductor foundry processes.

Peter ErslandShivarajiv Somisetty
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • process model
  • databases
  • optimal solution
  • stochastic processes
  • information retrieval
  • computer vision
  • case study
  • bayesian networks
  • x ray
  • highly reliable
  • gallium arsenide