Lifetime acceleration model for HAST tests of a pHEMT process.

Peter Ersland Hei-Ruey Jen Xinxing Yang

Published in: Microelectron. Reliab. (2004)

Keyphrases

process model
conceptual model
metamodel
probabilistic model
computational model
reasoning process
neural network model
experimental data
real time
least squares
statistical model
d objects
high level
sensitivity analysis
development process
neural network
database