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Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.

Antonio RaffoSergio Di FalcoGiovanna SozziRoberto MenozziDominique M. M.-P. SchreursGiorgio Vannini
Published in: Microelectron. Reliab. (2011)
Keyphrases
  • nonlinear dynamics
  • data analysis
  • image analysis
  • neural network
  • social networks
  • data sets
  • case study
  • markov chain
  • statistical analysis