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Giorgio Vannini
ORCID
Publication Activity (10 Years)
Years Active: 1990-2024
Publications (10 Years): 4
Top Topics
Focal Length
Hand Eye Coordination
Radially Symmetric
Error Analysis
Top Venues
BCICTS
I2MTC
IEEE Access
IEICE Trans. Electron.
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Publications
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Ken Kikuchi
,
Antonio Raffo
,
Valeria Vadalà
,
Gianni Bosi
,
Giorgio Vannini
,
Hiroshi Yamamoto
A New Calibration Technique of Electromagnetic Simulators for Accurate Analyses of Microwave Components on Epitaxial Wafers.
IEEE Access
12 (2024)
Hiroshi Yamamoto
,
Ken Kikuchi
,
Valeria Vadalà
,
Gianni Bosi
,
Antonio Raffo
,
Giorgio Vannini
Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers.
IEICE Trans. Electron.
(10) (2022)
Hiroshi Yamamoto
,
Ken Kikuchi
,
Norihiko Ui
,
Kazutaka Inoue
,
Valeria Vadalà
,
Gianni Bosi
,
Antonio Raffo
,
Giorgio Vannini
Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers.
BCICTS
(2018)
Gianni Bosi
,
Antonio Raffo
,
Giorgio Vannini
,
Gustavo Avolio
,
Dominique Schreurs
Impact of transistor model uncertainty on microwave load-pull simulations.
I2MTC
(2017)
Antonio Raffo
,
Valeria Vadalà
,
Pier Andrea Traverso
,
Alberto Santarelli
,
Giorgio Vannini
,
Fabio Filicori
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices.
Comput. Stand. Interfaces
33 (2) (2011)
Antonio Raffo
,
Sergio Di Falco
,
Giovanna Sozzi
,
Roberto Menozzi
,
Dominique M. M.-P. Schreurs
,
Giorgio Vannini
Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime.
Microelectron. Reliab.
51 (2) (2011)
Antonio Raffo
,
Valeria Di Giacomo
,
Pier Andrea Traverso
,
Alberto Santarelli
,
Giorgio Vannini
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.
IEEE Trans. Instrum. Meas.
58 (8) (2009)
Fabio Filicori
,
Paola Rinaldi
,
Giorgio Vannini
,
Alberto Santarelli
A new technique for thermal resistance measurement in power electron devices.
IEEE Trans. Instrum. Meas.
54 (5) (2005)
A. Costantini
,
Pier Andrea Traverso
,
Giorgio Vannini
Power amplifier ACPR simulation using standard harmonic balance tools.
ISCAS (5)
(2002)
Fabio Filicori
,
Vito A. Monaco
,
Giorgio Vannini
Mathematical approaches to electron device modelling for non-linear microwave circuit design: State of the art and present trends.
Eur. Trans. Telecommun.
1 (6) (1990)