Alberto Santarelli

Publication Activity (10 Years)

Years Active: 2005-2022
Publications (10 Years): 3

Top Topics

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Alberto Maria Angelotti, Gian Piero Gibiino, Alberto Santarelli, Pier Andrea Traverso
Broadband Measurement of Error Vector Magnitude for Microwave Vector Signal Generators Using a Vector Network Analyzer. IEEE Trans. Instrum. Meas. 71 (2022)
Gian Piero Gibiino, Alberto Maria Angelotti, Alberto Santarelli, Fabio Filicori, Pier Andrea Traverso
Multitone Multiharmonic Scattering Parameters for the Characterization of Nonlinear Networks. IEEE Trans. Instrum. Meas. 70 (2021)
Gian Piero Gibiino, Alberto Maria Angelotti, Alberto Santarelli, Fabio Filicori, Pier Andrea Traverso
S parameters: a Multi-Tone Multi-Harmonic Measurement Approach for the Characterization of Nonlinear Networks. I2MTC (2020)
Corrado Florian, Pier Andrea Traverso, Alberto Santarelli, Fabio Filicori
An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices. IEEE Trans. Instrum. Meas. 62 (10) (2013)
Antonio Raffo, Valeria Vadalà, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini, Fabio Filicori
A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices. Comput. Stand. Interfaces 33 (2) (2011)
Antonio Raffo, Valeria Di Giacomo, Pier Andrea Traverso, Alberto Santarelli, Giorgio Vannini
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime. IEEE Trans. Instrum. Meas. 58 (8) (2009)
Pier Andrea Traverso, Antonio Raffo, Massimo Pirazzini, Alberto Santarelli, Fabio Filicori
Automated microwave-device characterization setup based on a technology-independent generalized bias system. IEEE Trans. Instrum. Meas. 55 (4) (2006)
Fabio Filicori, Paola Rinaldi, Giorgio Vannini, Alberto Santarelli
A new technique for thermal resistance measurement in power electron devices. IEEE Trans. Instrum. Meas. 54 (5) (2005)