A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices.
Antonio RaffoValeria VadalàPier Andrea TraversoAlberto SantarelliGiorgio VanniniFabio FilicoriPublished in: Comput. Stand. Interfaces (2011)
Keyphrases
- low frequency
- high frequency
- frequency band
- electromagnetic fields
- frequency domain
- wavelet transform
- discrete wavelet transform
- subband
- low pass
- mobile devices
- wavelet coefficients
- wavelet analysis
- high resolution
- machine learning
- magnetic field
- original images
- high frequency components
- electromagnetic field
- low and high frequency
- contourlet transform
- bit rate
- multiscale
- similarity measure
- computer vision