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An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.

Antonio RaffoValeria Di GiacomoPier Andrea TraversoAlberto SantarelliGiorgio Vannini
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • nonlinear dynamics
  • neural network
  • semi automated
  • fully automated
  • dynamical systems
  • data sets
  • machine learning
  • reinforcement learning
  • electron beam