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Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers.

Hiroshi YamamotoKen KikuchiNorihiko UiKazutaka InoueValeria VadalàGianni BosiAntonio RaffoGiorgio Vannini
Published in: BCICTS (2018)
Keyphrases
  • real world
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  • statistical analysis
  • intra class