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Impact of transistor model uncertainty on microwave load-pull simulations.
Gianni Bosi
Antonio Raffo
Giorgio Vannini
Gustavo Avolio
Dominique Schreurs
Published in:
I2MTC (2017)
Keyphrases
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similarity measure
probabilistic model
management system
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computational model
theoretical framework
mathematical model
experimental data
information retrieval
prior knowledge
cost function
probability distribution
theoretical analysis
parameter estimation
partial information