Michele Esposto

Publication Activity (10 Years)

Years Active: 2010-2010
Publications (10 Years): 0

Publications

Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini
Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress. Microelectron. Reliab. 50 (9-11) (2010)