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Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs.

Mustapha FaqirGiovanni VerzellesiFausto FantiniFrancesca DanesinFabiana RampazzoGaudenzio MeneghessoEnrico ZanoniAnna CavalliniAntonio CastaldiniNathalie LabatAndré TouboulChristian Dua
Published in: Microelectron. Reliab. (2007)
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