GRAY SCALE
Experts
- Jan P. Allebach
- Chin-Chen Chang
- Jesús Angulo
- Isabelle Bloch
- Jing-Ming Guo
- Bogdan Smolka
- Oscar C. Au
- Soo-Chang Pei
- Edward R. Dougherty
- Yuk-Hee Chan
- Gonzalo R. Arce
- Robert Ulichney
- Etienne E. Kerre
- Wei Lu
- Gaurav Sharma
- Akira Taguchi
- Lamjed Ben Said
- Robert M. Haralick
- Sébastien Lefèvre
- Roger D. Hersch
- Peter Sussner
- Anastasios N. Venetsanopoulos
- Henk J. A. M. Heijmans
- Sos S. Agaian
- Konstantinos N. Plataniotis
- Brian L. Evans
- Santiago Velasco-Forero
- Zhigang Fan
- Kuo-Liang Chung
- Mike Nachtegael
- Marcos Eduardo Valle
- Dan Schonfeld
- Ming Sun Fu
- Laurent Najman
- Frank Y. Shih
- Hitoshi Kiya
- Slim Bechikh
- Takahiko Horiuchi
- Moon Gi Kang
Venues
- CoRR
- IEEE Trans. Image Process.
- ICIP
- ICASSP
- Multim. Tools Appl.
- IEEE Access
- Pattern Recognit.
- J. Electronic Imaging
- Sensors
- Pattern Recognit. Lett.
- ICPR
- EUSIPCO
- ISMM
- Color Imaging Conference
- Signal Process.
- ISCAS
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICDAR
- J. Vis. Commun. Image Represent.
- IEEE Trans. Circuits Syst. Video Technol.
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- CVPR
- Remote. Sens.
- ICIP (1)
- ICIP (2)
- IEEE Trans. Consumer Electron.
- IEEE Signal Process. Lett.
- ICIP (3)
- IGARSS
- J. Math. Imaging Vis.
- Signal Image Video Process.
- Color Imaging: Processing, Hardcopy, and Applications
- IEEE Trans. Signal Process.
- ICME
- Inf. Sci.
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Image Vis. Comput.
- Neurocomputing
- PICS
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