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Breakdown characterization of gate oxides in 35 and 70 Å BCD8 smart power technology.
Augusto Tazzoli
Lorenzo Cerati
A. Andreini
Gaudenzio Meneghesso
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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field effect transistors
data processing
power consumption
case study
cost effective
key technologies
energy management
real world
database
databases
data mining
steady state
personal computer
cmos technology
smart devices