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1GigaRad TID impact on 28 nm HEP analog circuits.

Federica RestaSimone GerardinS. MattiazzoAlessandro PaccagnellaMarcello De MatteisChristian C. EnzAndrea Baschirotto
Published in: Integr. (2018)
Keyphrases
  • analog circuits
  • digital circuits
  • fault diagnosis
  • high sensitivity
  • real time
  • machine learning
  • expert systems
  • query processing
  • social network analysis