Login / Signup
1GigaRad TID impact on 28 nm HEP analog circuits.
Federica Resta
Simone Gerardin
S. Mattiazzo
Alessandro Paccagnella
Marcello De Matteis
Christian C. Enz
Andrea Baschirotto
Published in:
Integr. (2018)
Keyphrases
</>
analog circuits
digital circuits
fault diagnosis
high sensitivity
real time
machine learning
expert systems
query processing
social network analysis