An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains.
Jorge Luis Lagos-BenitesDavide AppelloPaolo BernardiMichelangelo GrossoDanilo RavottoEdgar E. SánchezMatteo Sonza ReordaPublished in: DFT (2007)
Keyphrases
- fault diagnosis
- model based diagnosis
- multiple faults
- fault detection
- fault detection and diagnosis
- fault model
- fault identification
- fault detection and isolation
- root cause
- fault isolation
- fault models
- model based reasoning
- fault localization
- neural network
- scan data
- dynamic systems
- critical path
- medical diagnosis
- expert systems
- repair actions
- industrial processes
- transition model
- diagnostic reasoning
- fuzzy logic
- diagnostic tests
- condition monitoring
- incipient fault
- attention deficit hyperactivity disorder