FAULT IDENTIFICATION
Experts
- Steven X. Ding
- Krishnendu Chakrabarty
- Guang-Hong Yang
- Irith Pomeranz
- Bin Jiang
- Sudhakar M. Reddy
- Khashayar Khorasani
- Marios M. Polycarpou
- Donghua Zhou
- Maiying Zhong
- Shen Yin
- Thomas Parisini
- Jong-Myon Kim
- Nader Meskin
- Mohamed N. Nounou
- Hazem N. Nounou
- Peng Shi
- Majdi Mansouri
- Fengshou Gu
- Linlin Li
- Chuan Li
- Xuefeng Chen
- Ping Zhang
- Jinyong Yu
- Ying Yang
- Silvio Simani
- Vicenç Puig
- Krishna R. Pattipati
- Weihua Li
- Janusz Rajski
- Andrew D. Ball
- Fabrizio Lombardi
- Pabitra Mohan Khilar
- Mourad Elhadef
- Louis L. Whitcomb
- Mehrdad Saif
- Hiroshi Takahashi
- Ruqiang Yan
- Xiaoan Yan
Venues
- IEEE Access
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- CoRR
- IECON
- ACC
- IEEE Trans. Ind. Informatics
- CDC
- Expert Syst. Appl.
- IEEE Trans. Computers
- Eng. Appl. Artif. Intell.
- Autom.
- ECC
- Neurocomputing
- J. Frankl. Inst.
- Entropy
- ICRA
- Int. J. Syst. Sci.
- Appl. Soft Comput.
- ITC
- IAS
- SMC
- ISIE
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Control. Syst. Technol.
- J. Intell. Fuzzy Syst.
- I2MTC
- CAA SAFEPROCESS
- IEEE Trans. Autom. Control.
- Asian Test Symposium
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- DFT
- IEEE Trans. Syst. Man Cybern. Syst.
- Knowl. Based Syst.
- Neural Comput. Appl.
- SAFEPROCESS
- J. Electron. Test.
- Comput. Chem. Eng.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend