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Experts
- Steven X. Ding
- Krishnendu Chakrabarty
- Guang-Hong Yang
- Irith Pomeranz
- Sudhakar M. Reddy
- Bin Jiang
- Marios M. Polycarpou
- Khashayar Khorasani
- Donghua Zhou
- Maiying Zhong
- Shen Yin
- Nader Meskin
- Jong-Myon Kim
- Thomas Parisini
- Majdi Mansouri
- Peng Shi
- Hazem N. Nounou
- Mohamed N. Nounou
- Fengshou Gu
- Ping Zhang
- Xuefeng Chen
- Linlin Li
- Chuan Li
- Vicenç Puig
- Silvio Simani
- Jinyong Yu
- Ying Yang
- Krishna R. Pattipati
- Fabrizio Lombardi
- Andrew D. Ball
- Janusz Rajski
- Weihua Li
- Zhongkui Zhu
- Xiaoan Yan
- Ruqiang Yan
- Mehrdad Saif
- Hiroshi Takahashi
- Louis L. Whitcomb
- Pabitra Mohan Khilar
Venues
- IEEE Access
- Sensors
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Ind. Electron.
- CoRR
- IECON
- ACC
- IEEE Trans. Ind. Informatics
- CDC
- IEEE Trans. Computers
- Expert Syst. Appl.
- Eng. Appl. Artif. Intell.
- Autom.
- ECC
- Neurocomputing
- J. Frankl. Inst.
- Entropy
- ICRA
- Int. J. Syst. Sci.
- Appl. Soft Comput.
- ITC
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- ISIE
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Control. Syst. Technol.
- J. Intell. Fuzzy Syst.
- CAA SAFEPROCESS
- I2MTC
- Asian Test Symposium
- IEEE Trans. Autom. Control.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- IEEE Trans. Syst. Man Cybern. Syst.
- DFT
- SAFEPROCESS
- Neural Comput. Appl.
- Knowl. Based Syst.
- Comput. Chem. Eng.
- J. Electron. Test.
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