FAULT DETECTION AND ISOLATION
Experts
- Khashayar Khorasani
- Nader Meskin
- Irith Pomeranz
- Sudhakar M. Reddy
- Steven X. Ding
- Hiroshi Takahashi
- Vicenç Puig
- Marios M. Polycarpou
- Jong-Myon Kim
- Bin Jiang
- Silvio Simani
- Thomas Parisini
- Krishnendu Chakrabarty
- Guang-Hong Yang
- Janusz Rajski
- Yoshinobu Higami
- Hao Luo
- Chunhui Zhao
- Shen Yin
- Krishna R. Pattipati
- Donghua Zhou
- Mehrdad Saif
- Weihua Li
- Kewal K. Saluja
- Yuzo Takamatsu
- Chuan Li
- Andrew D. Ball
- Michel Kinnaert
- Srikanth Venkataraman
- Jianbo Yu
- Vincent Cocquempot
- Mohammad Reza Davoodi
- Hui Li
- Vishwani D. Agrawal
- Fengshou Gu
- Kaixiang Peng
- Andrea Monteriù
- Henrik Niemann
- Haiyang Pan
Venues
- IEEE Access
- IEEE Trans. Instrum. Meas.
- CoRR
- Sensors
- ACC
- IEEE Trans. Ind. Electron.
- CDC
- IEEE Trans. Ind. Informatics
- IEEE Trans. Computers
- IECON
- Expert Syst. Appl.
- Autom.
- ECC
- Eng. Appl. Artif. Intell.
- ITC
- IEEE Trans. Control. Syst. Technol.
- Neurocomputing
- Entropy
- Comput. Chem. Eng.
- J. Frankl. Inst.
- IEEE Trans. Autom. Control.
- Asian Test Symposium
- SMC
- Reliab. Eng. Syst. Saf.
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- CAA SAFEPROCESS
- Appl. Soft Comput.
- Int. J. Syst. Sci.
- Adv. Eng. Informatics
- J. Electron. Test.
- ETFA
- J. Intell. Fuzzy Syst.
- Inf. Sci.
- CCA
- DATE
- IAS
- MED
- INDIN
- VTS
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