FAULT DETECTION AND ISOLATION
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- Khashayar Khorasani
- Nader Meskin
- Irith Pomeranz
- Sudhakar M. Reddy
- Steven X. Ding
- Hiroshi Takahashi
- Vicenç Puig
- Marios M. Polycarpou
- Jong-Myon Kim
- Bin Jiang
- Silvio Simani
- Krishnendu Chakrabarty
- Thomas Parisini
- Janusz Rajski
- Yoshinobu Higami
- Guang-Hong Yang
- Krishna R. Pattipati
- Chunhui Zhao
- Hao Luo
- Shen Yin
- Donghua Zhou
- Kewal K. Saluja
- Weihua Li
- Mehrdad Saif
- Michel Kinnaert
- Yuzo Takamatsu
- Chuan Li
- Andrew D. Ball
- Srikanth Venkataraman
- Mohammad Reza Davoodi
- Vishwani D. Agrawal
- Jianbo Yu
- Hui Li
- Vincent Cocquempot
- Fengshou Gu
- Dimitri Lefebvre
- Hazem N. Nounou
- Shaohui Zhang
- Kaixiang Peng
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- IEEE Trans. Autom. Control.
- Asian Test Symposium
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- SMC
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
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- Int. J. Syst. Sci.
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- J. Electron. Test.
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