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A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.

Giusy IariaFrancesco AngionePaolo BernardiMatteo Sonza ReordaDavide AppelloGiuseppe GarozzoVincenzo Tancorre
Published in: LATS (2022)
Keyphrases
  • selection algorithm
  • distributed systems
  • prototype selection
  • spare parts
  • pattern matching
  • feature subset selection
  • image processing
  • search algorithm
  • high speed
  • optimization algorithm
  • selection scheme