Vincenzo Tancorre

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 17

Top Topics

Primitive Operations

Data Collection

Fault Injection

Selection Algorithm

Top Venues

Publications

Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips. IEEE Access 11 (2023)
Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre
A guided debugger-based fault injection methodology for assessing functional test programs. VTS (2023)
Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems. LATS (2023)
Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Vincenzo Tancorre
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults. DDECS (2023)
Paolo Bernardi, Lorenzo Cardone, Giusy Iaria, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
About the Correlation between Logical Identified Faulty Gates and their Layout Characteristics. IOLTS (2023)
Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72 (5) (2023)
F. Angione, Paolo Bernardi, G. Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip. ETS (2022)
F. Angione, Davide Appello, J. Aribido, J. Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, C. De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, M. Huch, Giusy Iaria, T. Kilian, R. Mariani, R. Martone, Annachiara Ruospo, E. Sanchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, L. Sterpone, Vincenzo Tancorre, Roberto Ugioli
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip. ETS (2022)
Gabriele Filipponi, Giusy Iaria, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
In-field Data Collection System through Logic BIST for large Automotive Systems-on-Chip. ITC (2022)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Parallel Multithread Analysis of Extremely Large Simulation Traces. IEEE Access 10 (2022)
Giusy Iaria, Tommaso Foscale, Paolo Bernardi, Luca Presicce, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
A novel SEU injection setup for Automotive SoC. ISIE (2022)
Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. LATS (2022)
Francesco Angione, Paolo Bernardi, A. Calabrese, L. Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
An innovative Strategy to Quickly Grade Functional Test Programs. ITC (2022)
Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli
Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level. DFT (2022)
Walter Ruggeri, Paolo Bernardi, Stefano Littardi, Matteo Sonza Reorda, Davide Appello, Claudia Bertani, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli
Innovative methods for Burn-In related Stress Metrics Computation. DTIS (2021)
Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Littardi, Giorgio Pollaccia, Stefano Quer, Vincenzo Tancorre, Roberto Ugioli
Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures. DDECS (2021)
F. Almeida, Paolo Bernardi, D. Calabrese, Marco Restifo, Matteo Sonza Reorda, Davide Appello, Giorgio Pollaccia, Vincenzo Tancorre, Roberto Ugioli, G. Zoppi
Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. DDECS (2019)
Mauricio de Carvalho, Paolo Bernardi, Matteo Sonza Reorda, Nicola Campanelli, Tamas Kerekes, Davide Appello, Mario Barone, Vincenzo Tancorre, Marco Terzi
Optimized embedded memory diagnosis. DDECS (2011)
Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
Embedded Memory Diagnosis: An Industrial Workflow. ITC (2006)
Davide Appello, Vincenzo Tancorre, Paolo Bernardi, Michelangelo Grosso, Maurizio Rebaudengo, Matteo Sonza Reorda
On the Automation of the Test Flow of Complex SoCs. VTS (2006)
Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre
Yield Analysis of Logic Circuits. VTS (2004)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. J. Electron. Test. 20 (1) (2004)
Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew
Understanding Yield Losses in Logic Circuits. IEEE Des. Test Comput. 21 (3) (2004)
Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante
Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores. ITC (2003)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. MTDT (2002)
Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques. IOLTW (2002)