Login / Signup
A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.
Davide Appello
Alessandra Fudoli
Vincenzo Tancorre
Fulvio Corno
Maurizio Rebaudengo
Matteo Sonza Reorda
Published in:
IOLTW (2002)
Keyphrases
</>
linear equations
neural network
medical diagnosis
embedded systems
closed form
fault diagnosis
digital images
artificial intelligence
data sets
evolutionary algorithm
optimal solution
low cost
image sequences
case study
optimization method
integer programming
data mining
model based diagnosis