A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress.

Francesco Angione Davide Appello Paolo Bernardi Claudia Bertani Giovambattista Gallo Stefano Littardi Giorgio Pollaccia Walter Ruggeri Matteo Sonza Reorda Vincenzo Tancorre Roberto Ugioli

Published in: IEEE Trans. Computers (2023)

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