Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.
Davide AppelloPaolo BernardiAlessandra FudoliMaurizio RebaudengoMatteo Sonza ReordaVincenzo TancorreMassimo ViolantePublished in: ITC (2003)
Keyphrases
- dynamic random access memory
- digital signal processors
- low cost
- model based diagnosis
- embedded systems
- memory size
- level parallelism
- general purpose
- medical diagnosis
- fault diagnosis
- memory usage
- computing power
- memory space
- multiple faults
- low memory
- memory requirements
- processor core
- clinically relevant
- diagnostic reasoning
- computational power
- address space
- model based reasoning
- main memory